簡要描述:導(dǎo)通電阻試驗(yàn)裝置 并記錄電阻值變化狀況,故又叫做 CAF試驗(yàn),絕緣阻力電阻試驗(yàn),或者是 OPEN/SHORT 試驗(yàn),我們將其統(tǒng)稱為絕緣劣化試驗(yàn)。
品牌 | 其他品牌 | 產(chǎn)地 | 進(jìn)口 |
---|---|---|---|
加工定制 | 是 | 使用電源 | AC100V 50/60Hz |
計(jì)測Channel數(shù) | 10CH | 計(jì)測電阻值范圍 | 2kΩ~10TΩ |
制御Channel數(shù) | 5~100CH(5Channel單位) | 主PC通信機(jī)能 | LAN接觸口×1 |
環(huán)境試驗(yàn)機(jī)通信機(jī)能 | RS-232C接觸口×2 | 自動(dòng)校正 | bias輸出補(bǔ)正,異常leak電流檢測 |
計(jì)測線 | TRIAXIAL線 (耐熱溫度:200度) |
導(dǎo)通電阻試驗(yàn)裝置
追求高性能、高信賴性、高便利性的系統(tǒng)構(gòu)成
RTm-100是可以單獨(dú)試驗(yàn)的ALL-IN-ONE檢測系統(tǒng),并且重要的試驗(yàn)數(shù)據(jù)被保存到CF存儲(chǔ)卡。
作為系統(tǒng)構(gòu)成我們準(zhǔn)備了40CH/100CH型,可以根據(jù)您的預(yù)算、設(shè)置空間來進(jìn)行選擇。
高機(jī)能
*用PC設(shè)定試驗(yàn)條件之后,就可以不使用PC來繼續(xù)進(jìn)行試驗(yàn)。
*使用ECM-100主機(jī)就可對(duì)HAST/試驗(yàn)槽進(jìn)行自動(dòng)控制,試驗(yàn)狀況可以用ECM-100進(jìn)行變更/監(jiān)視。
*HAST/試驗(yàn)槽的開門功能等的聯(lián)動(dòng)裝置功能也是標(biāo)準(zhǔn)裝備的
*沒有通信機(jī)能的HAST/試驗(yàn)槽,也可以通過模擬輸入來監(jiān)視濕度
導(dǎo)通電阻試驗(yàn)裝置
High speed
·The measurement circuit of an exclusive design and digital processing realize the high-speedscan of 50mseo /CH.
High precision
·The measurement circuit of an exclusive design eliminates a mechanical relay,and reduces theshift of the measurement data based on therrmoelectric power.
Highly efficient measurement cirouit
·The lock in amplifier of current measurement and voltage measurement is carried for everymeasurement board.The measurement signal buried in the noise is extracted and
measurement of the true minute resistance of a milliohm level is possible.
Noise prevention
·The noise spread on a measurement cable by twisted-pair cable adoption is reducedeffectively.
Easy maintenance
·Easy conservativeness is realized by the power supply part the control part and ameasurement part and modular structure adoption
Self-diagnostic funotion
·The resistance for self-diagnoses is carried for every measurement board, and the soundnesscheck of a measurement part is easy.
Small size and a light weight
·Since movement is also easy, the narrow space beside a chamber is utilized and a test can beperformed.